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Methodik schrubben manipulieren ioannis voyiatzis dblp Und Fülle LKW

PDF) A Low-Cost BIST Scheme for Test Vector Embedding in  Accumulator-Generated Sequences
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

Steffen Tarnick's research works | Universität Potsdam, Potsdam and other  places
Steffen Tarnick's research works | Universität Potsdam, Potsdam and other places

PDF) New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance  Faults
PDF) New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults

PDF) Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating  Technique
PDF) Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

Latest Award Winners
Latest Award Winners

Dimitris Magos's research works | University of West Attica, Athens  (TEIATH) and other places
Dimitris Magos's research works | University of West Attica, Athens (TEIATH) and other places

PDF) Test Embedding with Discrete Logarithms
PDF) Test Embedding with Discrete Logarithms

PDF) High-Level Test Synthesis for Delay Fault Testability
PDF) High-Level Test Synthesis for Delay Fault Testability

PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns  Generated in Universal Cellular Automata
PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

PDF) A domain-specific approach for software development on Manycore  platforms
PDF) A domain-specific approach for software development on Manycore platforms

PDF) Detection of Delay Faults in Memory Address Decoders
PDF) Detection of Delay Faults in Memory Address Decoders

PDF) Moduli Set Selection and Cost Estimation for RNS-Based FIR Filter and  Filter Bank Design
PDF) Moduli Set Selection and Cost Estimation for RNS-Based FIR Filter and Filter Bank Design

PDF) On the generation of pseudo-deterministic two-patterns test sequence  with LFSRs.
PDF) On the generation of pseudo-deterministic two-patterns test sequence with LFSRs.

PDF) Multimode scan: Test per clock BIST for IP cores
PDF) Multimode scan: Test per clock BIST for IP cores

Education and Information Technologies | Home
Education and Information Technologies | Home

PDF) Memory testing with a RISC microcontroller
PDF) Memory testing with a RISC microcontroller

Education and Information Technologies | Home
Education and Information Technologies | Home

Education and Information Technologies | Home
Education and Information Technologies | Home

PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing
PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing

PDF) Survival analysis for modeling critical events that communities may  undergo in dynamic social networks
PDF) Survival analysis for modeling critical events that communities may undergo in dynamic social networks

IVML > People > Phivos Mylonas
IVML > People > Phivos Mylonas

PDF) A Low-Cost BIST Scheme for Test Vector Embedding in  Accumulator-Generated Sequences
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

PDF) A Context-Aware Meeting Room: Mobile Interaction and Collaboration  Using Android, Java ME and Windows Mobile
PDF) A Context-Aware Meeting Room: Mobile Interaction and Collaboration Using Android, Java ME and Windows Mobile